Jiun-Shen Chen

Title: Jiun-Shen Chen: Innovator in Thin Film Measurement and Coating Technologies

Introduction

Jiun-Shen Chen is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of thin film measurement and coating technologies. With a total of 2 patents, his work showcases innovative methods and systems that enhance the precision and efficiency of these processes.

Latest Patents

One of Jiun-Shen Chen's latest patents is a method and system for measuring the thickness of thin films. This method involves establishing an artificial neural network based on a training database that includes modified spectra and corresponding film thicknesses. The process includes measuring a sample with a coated film to obtain a spectrum and using the trained neural network to estimate the thickness of the coated film. Additionally, he has developed a roll-to-roll hybrid plasma modular coating system. This system comprises multiple plasma processing units designed to lay thin layers onto substrate materials through advanced deposition techniques.

Career Highlights

Jiun-Shen Chen is affiliated with the Institute of Nuclear Energy Research, where he applies his expertise in developing cutting-edge technologies. His work not only contributes to academic research but also has practical applications in various industries.

Collaborations

Some of his notable coworkers include Cheng-Chang Hsieh and Ching-Pei Tseng, who collaborate with him on various projects related to thin film technologies.

Conclusion

Jiun-Shen Chen's innovative contributions to thin film measurement and coating systems highlight his role as a leading inventor in his field. His patents reflect a commitment to advancing technology and improving industrial processes.