This inventor holds 3 USPTO granted patents. Top assignee: Siemens Aktiengesellschaft. Active years: 1999-2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1999-2000
Title: Jiri Panyr and Industrial Process Analysis
Introduction
Jiri Panyr is an inventor associated with Munich, Germany, and Siemens Aktiengesellschaft. His work includes methods for analyzing process signals and process data in industrial plants, particularly power station plants. He is credited with 3 patents.
Latest Patents
One of Panyr’s latest patents describes a method for analyzing process signals in a technical plant. The method checks whether each signal belongs to particular functional units, then measures correlations between signals based on the units they share. It presents correlated signals as information elements, positioning them so that the distance between elements represents the strength of their correlation. This approach can support diagnosis and forecasting of system states.
Another patent concerns the analysis of process data in an industrial plant. It prescribes features that characterize the plant process and uses relevant parameters to check for those features across plant parts. The method identifies correlations among plant parts and features, then represents them as information elements whose relative distances indicate the degree of correlation. The approach is intended to support information compression, filtering, and timely fault diagnosis.
Career Highlights
Panyr’s patent work focuses on organizing complex industrial process information to make relationships among signals, plant parts, and process features easier to assess. The described methods use correlation-based representations to support analysis and operational diagnosis.
Collaborations
Panyr is associated with Siemens Aktiengesellschaft. His listed coworkers include Thorsten Fuhring and Hans-Gerd Mederer.
Conclusion
Jiri Panyr’s inventions apply structured data analysis and visual representations of correlation to industrial plant monitoring, diagnosis, and process understanding.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
