Company Filing History:
Years Active: 2009-2010
Title: Innovations of Jiong-Shiun Hsu in Optical Nanoindentation Measurement
Introduction
Jiong-Shiun Hsu is a prominent inventor based in Taichung, Taiwan. He has made significant contributions to the field of optical nanoindentation measurement, holding a total of 2 patents. His work focuses on developing advanced methods and devices that enhance the understanding of material properties at the nanoscale.
Latest Patents
One of his latest patents is titled "Device and method for optical nanoindentation measurement." This invention relates to a device and method that allows for precise measurement results by applying load to both fixed and non-fixed portions of a thin film. The method also incorporates a vibrating component to transmit dynamic properties, enabling the calculation of the Young's modulus, Poisson's ratio, and density of the thin film.
Another notable patent is the "Nano-indentation ultrasonic detecting system and method thereof." This system is designed to detect the mechanical properties of a target material through an indentation device that generates an indentation on the surface. It utilizes an ultrasonic generator and receiver to analyze the relationship between the Young's modulus and Poisson's ratio of the target material, providing valuable insights into its mechanical characteristics.
Career Highlights
Jiong-Shiun Hsu is affiliated with the Industrial Technology Research Institute, where he continues to innovate and contribute to research in material science. His work has implications for various industries, including electronics and materials engineering.
Collaborations
He has collaborated with notable colleagues such as Kai-Yu Cheng and Yu-Shyan Liu, further enhancing the research output and innovation potential within his field.
Conclusion
Jiong-Shiun Hsu's contributions to optical nanoindentation measurement exemplify the importance of innovation in understanding material properties. His patents reflect a commitment to advancing technology and improving measurement techniques in material science.