Shanghai, China

Jinsong Bao

This inventor holds 1 USPTO granted patent. Top assignee: Donghua University. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jinsong Bao. Retrieved from https://idiyas.com/inventor/jinsong-bao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Jinsong Bao: Innovator in Product Surface Defect Detection

Introduction

Jinsong Bao is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of product surface defect detection. His innovative approach focuses on enhancing the efficiency and accuracy of defect detection methods.

Latest Patents

Jinsong Bao holds a patent for a method titled "Method for constructing efficient product surface defect detection model based on network collaborative pruning." This method provides a network-based collaborative pruning technique to construct an efficient product surface defect detection model. It ensures the accuracy of product defect detection while reducing the detection time to meet manufacturers' requirements.

Career Highlights

Jinsong Bao is affiliated with Donghua University, where he continues to advance research in his field. His work emphasizes the importance of efficiency in product quality control processes.

Collaborations

He has collaborated with notable colleagues, including Jie Zhang and Junliang Wang, to further enhance the research and development of innovative detection methods.

Conclusion

Jinsong Bao's contributions to product surface defect detection exemplify the impact of innovation in manufacturing processes. His work not only improves accuracy but also addresses the critical need for efficiency in product quality assurance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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