Hwaseong, South Korea

Jinsik Yoon

This inventor holds 1 USPTO granted patent. Top assignee: Yonsei University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jinsik Yoon. Retrieved from https://idiyas.com/inventor/jinsik-yoon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jinsik Yoon and AI-Based 3D Image Reconstruction

Introduction

Jinsik Yoon is an inventor based in Hwaseong, South Korea, associated with Yonsei University. His patent work includes an artificial intelligence system designed to reconstruct a three-dimensional image from a two-dimensional X-ray image.

Latest Patents

Yoon is credited with 1 patent: “Image Reconstruction System and Method for Outputting 3D Synthesized Image from 2D X-Ray Image Based on Artificial Intelligence.” The invention describes a learning model trained using sample computed tomography images and corresponding synthesized images. At inference, the system processes a target two-dimensional Maximum Intensity Projection image to produce a three-dimensional synthesized image, with bones segmented and extracted in the training reference images.

Career Highlights

Yoon’s disclosed invention applies artificial intelligence to medical imaging, aiming to derive a three-dimensional representation from a two-dimensional X-ray image. The patent describes a workflow that includes preparing training images, learning from synthesized examples, and generating a final image from a target input.

Collaborations

The provided information lists Hyoungsik Kim and Dukyong Yoon as Yoon’s coworkers. It does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Jinsik Yoon’s patent reflects an application of artificial intelligence to medical image reconstruction, connecting two-dimensional X-ray input with synthesized three-dimensional output.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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