Beijing, China

Jinlong Hu

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Beijing Jingdong Qianshi Technology., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jinlong Hu. Retrieved from https://idiyas.com/inventor/jinlong-hu-wu55t60w

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jinlong Hu: Innovator in Target Detection Technology

Introduction

Jinlong Hu is a prominent inventor based in Beijing, China. He has made significant contributions to the field of target detection technology. His innovative approach has led to the development of a unique method and apparatus for updating target detection models.

Latest Patents

Jinlong Hu holds a patent for a "Method and apparatus for updating target detection model." This patent discloses a method that involves constructing a three-dimensional model of a target article using image data captured from multiple angles. The process includes generating a synthetic image that represents the target article, obtaining training samples, and ultimately training a target detection model to produce an updated version.

Career Highlights

Jinlong Hu is associated with Beijing Jingdong Qianshi Technology, Ltd., where he applies his expertise in technology and innovation. His work has been instrumental in advancing the capabilities of target detection systems.

Collaborations

Jinlong Hu collaborates with notable colleagues, including Weifeng Liu and Jichang Shan. Their combined efforts contribute to the ongoing development of cutting-edge technologies in their field.

Conclusion

Jinlong Hu's innovative work in target detection technology exemplifies the impact of dedicated inventors in advancing modern technology. His contributions continue to shape the future of this important field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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