Location History:
- Urbana, IL (US) (2004)
- Champaign, IL (US) (2018 - 2022)
Company Filing History:
Years Active: 2004-2022
Title: Innovations of Jinju Lee in Scanning Probe and Electron Microscope Probes
Introduction
Jinju Lee is a prominent inventor based in Champaign, IL (US), known for her significant contributions to the field of microscopy. With a total of four patents to her name, she has made remarkable advancements in the manufacturing of scanning probe and electron microscope probes.
Latest Patents
Jinju Lee's latest patents focus on the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. The methods described involve mounting multiple wires on a stage and ion milling them simultaneously. This process is conducted while the stage and mounted probes are tilted at a selected angle relative to the ion source and rotated. The resulting probes are characterized by their highly uniform probe tips, which possess controllable properties for stable and accurate scanning probe and electron microscope measurements.
Career Highlights
Throughout her career, Jinju Lee has worked with notable organizations such as Tiptek, LLC and the University of Illinois. Her work has significantly impacted the field of microscopy, enhancing the capabilities of scanning probe and electron microscope technologies.
Collaborations
Jinju Lee has collaborated with esteemed colleagues, including Joseph W. Lyding and Gregory S. Girolami, further enriching her research and innovations in the field.
Conclusion
Jinju Lee's contributions to the development of scanning probe and electron microscope probes highlight her innovative spirit and dedication to advancing scientific research. Her work continues to influence the field and inspire future innovations.