Beijing, China

Jingwei Shi

This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignee: Nec (china)co., Ltd.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jingwei Shi. Retrieved from https://idiyas.com/inventor/jingwei-shi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Innovations by Jingwei Shi

Introduction

Jingwei Shi is a notable inventor based in Beijing, China. He has made significant contributions to the field of automatic object classification. His innovative approach enhances the accuracy and user-friendliness of object classification systems.

Latest Patents

Jingwei Shi holds a patent for a "Method and system for automatic objects classification." This invention provides a comprehensive method that includes acquiring a set of objects, classifying them based on query logs, and utilizing ontological information to generate classification results. The final classification result is achieved by semantically fusing the initial results, thereby improving the overall accuracy of the classification process.

Career Highlights

Jingwei Shi is currently employed at NEC (China) Co., Ltd. His work focuses on developing advanced technologies that streamline object classification processes. His expertise in this area has positioned him as a valuable asset in his field.

Collaborations

Jingwei has collaborated with notable coworkers, including Jianqiang Li and Xin Meng. Their combined efforts contribute to the advancement of innovative solutions in technology.

Conclusion

Jingwei Shi's contributions to automatic object classification demonstrate his commitment to innovation and technology. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving classification systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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