Hong Kong, China

Jingmeng Sun

This inventor holds 1 USPTO granted patent. Top assignee: Neoid Limited (Shenzhen). Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jingmeng Sun. Retrieved from https://idiyas.com/inventor/jingmeng-sun

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jingmeng Sun

Introduction: Jingmeng Sun is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of radio frequency technology. His innovative work has led to the development of a unique RF tag that incorporates a resonant circuit structure.

Latest Patents: Jingmeng Sun holds 1 patent for his invention titled "RF tag with resonant circuit structure." This patent describes an RF tag that includes a resonant circuit structure and an RF device. The resonant circuit structure consists of a first conducting layer, a second conducting layer spaced apart from the first conducting layer, and at least one conducting base portion connecting one end of the first conducting layer and one end of the second conducting layer. Additionally, a layer of dielectric material is inserted between the first and second conducting layers. The impedance of the resonant circuit structure is matched with the impedance of the RF device, and a slit is formed on the first conducting layer, where the RF device is electrically coupled and disposed over the slit.

Career Highlights: Jingmeng Sun is currently associated with Neoid Limited, a company based in Shenzhen. His role at Neoid Limited allows him to further explore and develop his innovative ideas in the field of RF technology.

Conclusion: Jingmeng Sun's contributions to the field of radio frequency technology through his innovative RF tag design highlight his expertise as an inventor. His work continues to influence advancements in this area, showcasing the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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