This inventor holds 1 USPTO granted patent. Top assignees: Jiangsu Yangtze Testing and Certification Co., Ltd., Jinling Customs Technnology Center. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024
Title: Jingling Wang: Innovator in Microfluidic Detection Technology
Introduction
Jingling Wang is a prominent inventor based in Jiangsu, China. He has made significant contributions to the field of microfluidic technology, particularly in the detection of heavy metal ions. His innovative approach combines advanced materials and 3D printing techniques to create efficient detection systems.
Latest Patents
Wang holds a patent for an "Electrode-modified heavy metal ion microfluidic detection chip and preparation method." This invention features a microfluidic module that is integrally molded by 3D printing. The chip includes a microchannel and a sensor slot, with a three-electrode sensor that comprises three electrodes printed on a card-shaped bottom plate. The working electrode is a porous nano-NiMn2O4 modified bare carbon electrode, which enhances the chip's detection capabilities.
Career Highlights
Throughout his career, Jingling Wang has worked with notable organizations, including Jiangsu Yangtze Testing and Certification Co., Ltd. and Jinling Customs Technology Center. His experience in these companies has allowed him to refine his skills and contribute to various projects in the field of testing and certification.
Collaborations
Wang has collaborated with several professionals in his field, including Ying Hong and Jiansong Chen. These partnerships have fostered innovation and the exchange of ideas, further enhancing the development of microfluidic technologies.
Conclusion
Jingling Wang's work in microfluidic detection technology exemplifies the impact of innovative thinking in addressing environmental challenges. His contributions continue to pave the way for advancements in the detection of heavy metal ions, showcasing the importance of research and development in this critical area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile