Edison, NJ, United States of America

Jing-Yang Jou

This inventor holds 1 USPTO granted patent. Top assignee: Lucent Technologies Inc.. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jing-Yang Jou. Retrieved from https://idiyas.com/inventor/jing-yang-jou-1jwjyd0d

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jing-Yang Jou

Introduction

Jing-Yang Jou is a notable inventor based in Edison, NJ (US). He has made significant contributions to the field of digital integrated circuits. His work focuses on enhancing the testability of these circuits while maintaining their performance characteristics.

Latest Patents

Jou holds a patent for a "Method and integrated circuit adapted for partial scan testability." This invention provides a method and apparatus that modify digital integrated circuits for partial scan testing. The approach minimizes the impact on the circuit's performance. The scan memory elements are selected based on their ability to eliminate feedback cycles and considerations of potential performance degradation.

Career Highlights

Jing-Yang Jou has had a successful career at Lucent Technologies Inc., where he has applied his expertise in integrated circuits. His innovative methods have contributed to advancements in the industry.

Collaborations

Jou has collaborated with Kwang-Ting Cheng, a talented woman in the field. Their partnership has likely fostered further innovations and improvements in their respective areas of expertise.

Conclusion

Jing-Yang Jou's contributions to integrated circuit technology demonstrate his commitment to innovation and excellence. His patent reflects a significant advancement in the field, showcasing his ability to enhance circuit performance while ensuring testability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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