This inventor holds 1 USPTO granted patent. Top assignee: Forschungszentrum Juelich Gmbh. Active years: 2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020
Title: Innovations by Jing Li in Voltage Measurement Technology.
Introduction
Jing Li is an accomplished inventor based in Juelich, Germany. He has made significant contributions to the field of measurement technology, particularly in the area of small voltages and potentials on various samples. His innovative approach has led to advancements that enhance the sensitivity and accuracy of measurements in biological and chemical applications.
Latest Patents
Jing Li holds a patent for a device and method for measuring small voltages and potentials on biological, chemical, or other samples. The patent describes a device that includes at least one field effect transistor, which comprises a source, a drain, and a gate that is insulated from the conducting channel. This design allows for the application of a voltage between the source and drain, as well as a bias voltage to the gate. The gate dielectric features attachment sites that can trap and release charge carriers, improving the measurement's sensitivity and accuracy by utilizing telegraph modulation signals.
Career Highlights
Jing Li is associated with Forschungszentrum Juelich GmbH, where he continues to develop innovative technologies. His work has been instrumental in advancing measurement techniques that are crucial for various scientific applications. With a focus on enhancing measurement capabilities, he has established himself as a key figure in his field.
Collaborations
Jing Li collaborates with talented individuals such as Svetlana Vitusevich and Sergli Pud. Their combined expertise contributes to the success of their projects and the advancement of measurement technologies.
Conclusion
Jing Li's contributions to the field of voltage measurement technology demonstrate his innovative spirit and commitment to scientific advancement. His patented device significantly improves measurement sensitivity and accuracy, marking a notable achievement in his career.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
