Hangzhou, China

Jing Jie

This inventor holds 1 USPTO granted patent. Top assignees: Xinjiang Institute of Technology, Zhejiang University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jing Jie. Retrieved from https://idiyas.com/inventor/jing-jie

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jing Jie: Inventor Advancing Cable Quality Inspection

Introduction

Jing Jie is an inventor associated with Hangzhou, China. Her work includes a patented image-processing method designed to improve the accuracy of cable quality inspection.

Latest Patents

Jing Jie is associated with 1 patent, titled “Method for Eliminating Scratches in Cross-Sectional Image of Cable.” The method acquires an original cable cross-section image, applies dilation and erosion to create a processed image, and fuses the two images. It then processes the fused image to produce a scratch-eliminated image for use in cable quality detection. By combining multimodal features, the approach aims to preserve information from the original image while reducing scratches and improving inspection accuracy.

Career Highlights

Jing Jie’s listed organizational affiliations include Zhejiang University and Xinjiang Institute of Technology. Her patent work applies image processing to a practical challenge in cable manufacturing and quality control.

Collaborations

Her listed coworkers include Aihua Yu and Beiping Hou, reflecting collaborative connections in her professional work.

Conclusion

Jing Jie’s patented method uses image fusion and processing to address scratches in cable cross-section images, with the goal of supporting more accurate quality inspection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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