Jin Wook Jang

Title: Innovations of Jin Wook Jang in Crack Detection Technology

Introduction

Jin Wook Jang is a notable inventor based in Asan-si, South Korea. He has made significant contributions to the field of crack detection technology, holding 2 patents that showcase his innovative approach to solving complex engineering problems.

Latest Patents

One of Jin Wook Jang's latest patents is a crack detection chip and a crack detection method using the same. This invention includes a chip that features an internal region and an external region surrounding it. A guard ring is formed inside the chip along its edge to define these regions. The edge wiring is disposed along the edge of the internal region in the form of a closed curve, with a pad exposed on the chip's surface and connected to the edge wiring. The edge wiring connects to a Time Domain Reflectometry (TDR) module, which applies an incident wave through the pad and detects a reflected wave to identify the position of a crack.

Career Highlights

Jin Wook Jang is currently employed at Samsung Electronics Co., Ltd., where he continues to develop innovative technologies. His work has been instrumental in advancing the capabilities of crack detection systems, which are crucial in various engineering applications.

Collaborations

Some of his notable coworkers include Chan-Sik Kwon and Jin Duck Park, who have collaborated with him on various projects within the company.

Conclusion

Jin Wook Jang's contributions to crack detection technology exemplify the importance of innovation in engineering. His patents reflect a commitment to enhancing safety and reliability in structural integrity assessments.