Company Filing History:
Years Active: 1996
Title: Jin-Hua Hong: Innovator in Boundary Scan Technology
Introduction
Jin-Hua Hong is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of boundary scan technology, particularly through his innovative patent. His work has implications for testing and verifying integrated circuits, which are essential in modern electronics.
Latest Patents
Jin-Hua Hong holds a patent for an IEEE Std. 1149.1 boundary scan circuit capable of built-in self-testing. This invention includes a logic circuit, cascaded input boundary-scan cells forming an input boundary-scan register connected to input nodes of the logic circuit, and cascaded output boundary-scan cells forming an output boundary-scan register connected to output nodes of the logic circuit. The patent also features a test access port system that controls the operation of the input and output boundary-scan cells. This system provides a built-in self-test control signal to facilitate testing. The input boundary-scan register can be reconfigured to act as a test pattern generator, while the output boundary-scan register can function as an output response analyzer. Additionally, a family of input and output boundary-scan cells that can be reconfigured as a linear feedback shift register and a multiple-input shift register is disclosed in the patent.
Career Highlights
Jin-Hua Hong is affiliated with the National Science Council of the Republic of China, where he has been involved in research and development activities. His work has been instrumental in advancing boundary scan technology, which is crucial for ensuring the reliability of electronic devices.
Collaborations
He has collaborated with notable colleagues, including Ching-Hong Tsai and Fang-Diahn Guo, contributing to various projects and research initiatives in the field.
Conclusion
Jin-Hua Hong's contributions to boundary scan technology through his innovative patent demonstrate his expertise and commitment to advancing the field of electronics. His work continues to influence the development of reliable testing methods for integrated circuits.