Seoul, South Korea

Jin-Hoon Kim

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: A-Sen Company. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jin-Hoon Kim. Retrieved from https://idiyas.com/inventor/jin-hoon-kim-sialcrsz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jin-Hoon Kim and a Wearable Pressure Ulcer Detection System.

Introduction

Jin-Hoon Kim is an inventor based in Seoul, South Korea. His patent work includes a wearable sensor designed to support pressure ulcer detection.

Latest Patents

The provided information lists one patent for Kim: “Wearable Pressure Ulcer Detection Sensor and Pressure Ulcer Detection System Including the Same.” The invention combines a pressure sensor that measures pressure through capacitance changes caused by physical force, a temperature sensor that measures temperature through changes in electrical conductivity associated with electron hopping, and an impedance sensor with two electrodes that contact the skin.

Career Highlights

Kim is associated with A-Sen Company. His listed patent brings together pressure, temperature, and skin-impedance sensing in a wearable system intended for pressure ulcer detection. The supplied information does not specify the patent’s filing or grant date.

Collaborations

The provided data names Jin-woo Park and Seung-Rok Kim as Kim’s coworkers. It does not describe their specific roles in the patent or related work.

Conclusion

Jin-Hoon Kim’s listed invention combines multiple sensing methods in a wearable approach to pressure ulcer detection, reflecting his patent activity and association with A-Sen Company.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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