Goyang-si, South Korea

Jin An Oh


Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Jin An Oh: Innovator in Semiconductor Testing Technology

Introduction: Jin An Oh is a prominent inventor based in Goyang-si, South Korea. She has made significant contributions to the field of semiconductor testing technology. Her innovative approach has led to the development of a unique device that enhances the testing process for semiconductor devices.

Latest Patents: Jin An Oh holds a patent for a "Device under test tester using redriver." This invention is designed to improve the efficiency of testing semiconductor devices by applying electrical signals and measuring their responses. The DUT tester includes a DUT test unit, a printed circuit board (PCB) with connectors, and redrivers that compensate for signal distortion caused by variations in transmission distance. This technology is crucial for ensuring the integrity of test signals.

Career Highlights: Jin An Oh is currently associated with Unitest Inc., where she continues to innovate and develop advanced testing solutions. Her work has been instrumental in enhancing the reliability and accuracy of semiconductor testing processes.

Conclusion: Jin An Oh's contributions to semiconductor testing technology exemplify her dedication to innovation and excellence in her field. Her patent and ongoing work at Unitest Inc. highlight her role as a leading inventor in the industry.

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