Gwangju, South Korea

Jin An Jung

This inventor holds 3 USPTO granted patents and 3 published patent applications. Top assignees: Jusung Engineering Co., Ltd., Jusung Engineering Co., Ltd.. Active years: 2023-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jin An Jung. Retrieved from https://idiyas.com/inventor/jin-an-jung-3dhdj6li

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023-2026

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3 patents (USPTO):Explore Patents

Title: Innovations by Jin An Jung in Substrate Inspection Technology

Introduction

Jin An Jung is a notable inventor based in Gwangju-Si, South Korea. He has made significant contributions to the field of substrate inspection technology. With a total of 3 patents, his work focuses on enhancing the monitoring and analysis of substrates in various processing states.

Latest Patents

Jin An Jung's latest patents include a substrate inspection device and a substrate inspection method. These innovations provide a comprehensive solution for monitoring substrates to determine their processed state and inspect for any abnormalities. The device features a substrate mounting part that moves relative to the substrate, allowing for effective monitoring. It includes a measurement part for monitoring the substrate, a control part that manages the movement path of the measurement part, and an analysis part that determines the presence of abnormalities based on monitoring information from multiple substrates.

Career Highlights

Jin An Jung is currently employed at Jusung Engineering Co., Ltd., where he continues to develop innovative solutions in substrate inspection technology. His work has been instrumental in advancing the capabilities of substrate monitoring systems.

Collaborations

Some of his coworkers include Gu Hyun Jung and Young Rok Kim, who contribute to the collaborative efforts in their projects.

Conclusion

Jin An Jung's contributions to substrate inspection technology demonstrate his commitment to innovation and excellence in his field. His patents reflect a deep understanding of the complexities involved in substrate monitoring and analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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