Montreal, Canada

Jimmy Leroux

This inventor holds 1 USPTO granted patent. Top assignee: Airy3d Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jimmy Leroux. Retrieved from https://idiyas.com/inventor/jimmy-leroux

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jimmy Leroux and Biometric Anti-Spoofing Innovation.

Introduction

Jimmy Leroux is an inventor associated with Montreal, Canada, and Airy3D Inc. His patent work addresses biometric anti-spoofing, using depth information and neural networks to help distinguish genuine biometric objects from spoofed ones.

Latest Patents

Leroux is credited with 1 patent: “Methods and Systems Using Depth Imaging for Training and Deploying Neural Networks for Biometric Anti-Spoofing.” The disclosed method processes images of a biometric object captured from two different viewpoints. A disparity encoder maps the image pair to an encoded signal containing disparity information, which a classification branch then uses to estimate whether the object is genuine or spoofed. The patent also describes training techniques that combine disparity-map estimation and spoofing detection within a neural network.

Career Highlights

Leroux’s listed patent connects depth imaging with machine-learning methods for biometric security. The approach uses differences between viewpoints as a source of information for detecting presentation attacks.

Collaborations

Leroux is associated with Airy3D Inc. His listed coworkers include Nicolas Laliberte and Ji-ho Cho.

Conclusion

Jimmy Leroux’s patent work focuses on applying depth imaging and neural networks to biometric anti-spoofing, contributing a technical approach to distinguishing genuine biometric objects from spoofed presentations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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