Company Filing History:
Years Active: 2016
Title: The Innovative Contributions of Jim Eastman
Introduction
Jim Eastman is a notable inventor based in San Francisco, California. He has made significant contributions to the field of capacitive sensor testing. His innovative approach has led to the development of a unique testing method that enhances the reliability of capacitive sensors in various devices.
Latest Patents
Jim Eastman holds a patent for a "Test pattern membrane and method for testing capacitive sensors." This invention utilizes a test pattern membrane to effectively test the capacitive sensors of a device. The method involves placing the device in a test fixture and initially reading the capacitive sensors without the test pattern membrane to establish baseline measurements. The test pattern membrane, which features a series of conductive areas on a non-conductive substrate, is then applied to the device. The conductive areas are strategically arranged to correspond with the capacitive sensors' layout. After applying the membrane, the sensors are read again to obtain stimulated measurements. The differences between the baseline and stimulated readings are analyzed to determine the functionality of each sensor based on a predefined threshold.
Career Highlights
Jim Eastman is currently employed at Pure Imagination, LLC, where he continues to innovate and develop new technologies. His work focuses on improving the accuracy and efficiency of sensor testing methods. With a strong background in engineering and technology, Eastman has established himself as a valuable asset in his field.
Collaborations
Jim collaborates with talented individuals such as Michael Wayne Wallace and Philip Trevor Odom. Their combined expertise fosters a creative environment that drives innovation and enhances the development of new technologies.
Conclusion
Jim Eastman's contributions to the field of capacitive sensor testing exemplify the spirit of innovation. His patented method not only improves testing accuracy but also sets a standard for future developments in sensor technology.