The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Mar. 17, 2014
Pure Imagination, Llc, Vancouver, WA (US);
Michael Wallace, Vancouver, WA (US);
Philip T. Odom, Portland, OR (US);
Brian Richardson, Portland, OR (US);
Jim Eastman, San Francisco, CA (US);
Pure Imagination, LLC, Vancouver, WA (US);
Abstract
A test pattern membrane test method uses a test pattern membrane to test the capacitive sensors of a device. The device is placed in the test fixture. The capacitive sensors are read without the test pattern membrane, storing as a set of baseline measurements. The test pattern membrane is placed on the unit to be tested. The test pattern membrane has a plurality of conductive areas on a non-conductive substrate. The conductive areas are arranged in a pattern that corresponds to the pattern of capacitive sensors. The sensors are read again to obtain a set of stimulated measurements. Differences for each of the sensors are determined between the sensor readings with and without the test pattern membrane in place. This difference is compared to a threshold. A sensor is considered to be functioning properly if the difference value is greater than the sensor's threshold value.