Snohomish, WA, United States of America

Jim C Hartl

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jim C Hartl. Retrieved from https://idiyas.com/inventor/jim-c-hartl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:

goldMedal1 out of 834,453 
Other
 patents

Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Jim C Hartl - Innovator in Laser Measurement Systems

Introduction

Jim C Hartl is a notable inventor based in Snohomish, WA (US). He has made significant contributions to the field of measurement technology, particularly with his innovative laser measurement system. His work has implications for various applications, especially in the automotive industry.

Latest Patents

Jim C Hartl holds 1 patent for his invention of a laser measurement system. This system is designed to indicate the difference between the actual position of a vehicle frame reference point and a normal position. It employs a rotating laser scanner, an electro-optical detector, and a host computer to achieve accurate measurements. The system operates by querying the scanner and detector, calculating the actual position, and displaying the difference effectively.

Career Highlights

Throughout his career, Jim has focused on developing technologies that enhance precision in measurement. His innovative approach has led to advancements that benefit various sectors, particularly in ensuring the accuracy of vehicle frame alignments.

Collaborations

Jim has worked alongside talented individuals such as Michael T Hanchett and Darryl W Koop. Their collaborative efforts have contributed to the successful development and implementation of his patented technologies.

Conclusion

Jim C Hartl's contributions to laser measurement technology exemplify the impact of innovation in enhancing precision and accuracy in various applications. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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