Hefei, China

Jim Baste

This inventor holds 8 USPTO granted patents. Top assignee: Nio Technology (Anhui) Co., Ltd.. Active years: 2023-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jim Baste. Retrieved from https://idiyas.com/inventor/jim-baste-4xlc3z6b

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 7

Forward Citations = 70(Granted Patents)


Location History:

  • Hefei, CN (2023 - 2024)
  • Anhui, CN (2024)

Company Filing History:


Years Active: 2023-2024

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8 patents (USPTO):Explore Patents

Title: Jim Baste: Innovator in Automotive Design

Introduction

Jim Baste is a prominent inventor based in Hefei, China, known for his contributions to the automotive industry. With a total of eight registered patents, Baste has focused on developing innovative solutions that enhance vehicle design and functionality.

Latest Patents

Among his most recent inventions is a motor vehicle body, which showcases his commitment to improving automotive engineering. This patent exemplifies Baste's keen insight into the needs of modern transportation.

Career Highlights

Jim Baste is associated with Nio Technology (Anhui) Co., Ltd., a company renowned for its electric vehicles and advanced automotive technologies. His role at Nio has allowed him to leverage his inventive skills in a rapidly evolving industry.

Collaborations

Throughout his career, Baste has worked alongside skilled professionals such as Kris Tomasson and Oliver Samson. These collaborations have played a critical role in refining and promoting innovative vehicle designs that elevate the overall driving experience.

Conclusion

As an inventor, Jim Baste has made significant contributions to the automotive field through his patents and collaborative efforts. His work continues to inspire advancements in vehicle technology, reflecting a promising future for automotive innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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