Qingdao, China

Jili Wang

This inventor holds 1 USPTO granted patent. Top assignees: Haier Group Corporation, Qingdao Haier Special Icebox Co., Ltd.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jili Wang. Retrieved from https://idiyas.com/inventor/jili-wang-qnvgti08

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Jili Wang - Innovator in Freezer Technology

Introduction

Jili Wang is a notable inventor based in Qingdao, China. He has made significant contributions to the field of refrigeration technology. His innovative approach has led to the development of a unique product that enhances the functionality of freezers.

Latest Patents

Jili Wang holds a patent for a Double Layer Glass Door Freezer. This invention showcases his ability to combine practicality with advanced technology. The patent reflects his commitment to improving user experience in refrigeration.

Career Highlights

Throughout his career, Jili Wang has worked with prominent companies such as Qingdao Haier Special Icebox Co., Ltd. and Haier Group Corporation. His experience in these organizations has allowed him to refine his skills and contribute to the advancement of freezer technology.

Collaborations

Jili Wang has collaborated with talented individuals in his field, including Jingchun Wang and Wei Bian. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Jili Wang's contributions to the refrigeration industry, particularly through his patented Double Layer Glass Door Freezer, highlight his innovative spirit and dedication to enhancing technology. His work continues to influence the field and inspire future inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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