Company Filing History:
Years Active: 2024
Title: Jijie Yang: Innovator in Platform Gauge Measurement Technology
Introduction
Jijie Yang is a notable inventor based in Ningbo, China. He has made significant contributions to the field of measurement technology, particularly with his innovative approach to platform gauge instruments. His work focuses on enhancing the precision and efficiency of gauge measurements, which are crucial in various engineering applications.
Latest Patents
Jijie Yang holds a patent for a "Platform gauge instrument and platform gauge measuring method based on photogrammetric principle." This invention provides a sophisticated platform gauge instrument that utilizes photogrammetric principles to ensure accurate measurements. The design includes measuring stations positioned on both sides of a platform, which work collaboratively to gather comprehensive platform information. The measuring stations are equipped with automatic traveling capabilities, allowing them to scan the entire platform efficiently. The system automatically resolves the gathered data to determine critical gauge dimensions, achieving high-precision detection in real-time.
Career Highlights
Jijie Yang is affiliated with the Ningbo Special Equipment Inspection and Research Institute, where he applies his expertise in measurement technology. His innovative contributions have positioned him as a key figure in the development of advanced measurement instruments. His work not only enhances the accuracy of measurements but also streamlines the process, making it more efficient for various applications.
Collaborations
Jijie Yang collaborates with esteemed colleagues such as Faju Qiu and Wei Chen. Their combined expertise fosters an environment of innovation and progress in the field of measurement technology.
Conclusion
Jijie Yang's contributions to platform gauge measurement technology exemplify the impact of innovation in engineering. His patented inventions and collaborative efforts continue to advance the field, ensuring greater accuracy and efficiency in measurements.