The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2024
Filed:
May. 17, 2023
Ningbo Special Equipment Inspection and Research Institute, Ningbo, CN;
Faju Qiu, Ningbo, CN;
Wei Chen, Ningbo, CN;
Jijie Yang, Ningbo, CN;
Xiangning Kuang, Ningbo, CN;
Gaoyao Ding, Ningbo, CN;
Yiyi Zhang, Ningbo, CN;
Jianer Wang, Ningbo, CN;
Jinhui Yang, Ningbo, CN;
Abstract
A platform gauge instrument and a platform gauge measuring method based on a photogrammetric principle are provided. According to the platform gauge instrument, measuring stations are arranged on both sides of a platform, and the measuring stations on both sides work together to ensure the acquisition of complete platform information. The measuring stations have automatic traveling capability to complete scanning of a whole platform, platform information obtained by the scanning is automatically resolved by a measuring system, and gauge dimensions such as a transverse dimension and a vertical dimension of a platform gauge are resolved through parameters such as object-space coordinates of platform edge points, a space equation of intersection lines of upper surfaces of rails and a measuring cross-section, and common tangent lines of the upper surfaces of two rails on the measuring cross-section, so that resident and real-time gauge high-precision detection of the platform is achieved.