This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2000
Title: Jihong Chen: Innovator in Computer Aided Inspection Technology
Introduction
Jihong Chen is a notable inventor based in Wuhan, China. He has made significant contributions to the field of inspection technology, particularly through his innovative patent that enhances the accuracy and efficiency of object inspections.
Latest Patents
Jihong Chen holds a patent for a Computer Aided Inspection Machine. This invention involves an automatic inspection method and apparatus that utilizes structured light and machine vision cameras to inspect objects in conjunction with their geometric models. The technology analyzes camera images to produce three-dimensional locations of points on an object's surfaces. During the setup phase, points are evaluated against the geometric model to minimize data collection and analysis time while reducing errors caused by extraneous reflections. The inspection device employs multiple multiplexed sensors, each consisting of a camera and a structured light source, allowing for comprehensive measurements of all sides of an object in a single pass. Calibration and compensation methods are also included in the patent.
Career Highlights
Throughout his career, Jihong Chen has demonstrated a commitment to advancing inspection technologies. His innovative approach has led to the development of methods that significantly improve measurement accuracy and efficiency in various applications.
Collaborations
Jihong Chen has collaborated with notable colleagues, including Hui Cheng Zhou and Dao Shan Yang. Their combined expertise has contributed to the success of his projects and innovations.
Conclusion
Jihong Chen's work in computer-aided inspection technology exemplifies the impact of innovation in enhancing industrial processes. His contributions continue to influence the field and pave the way for future advancements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile