Hsinchu, Taiwan

Jih-Sheng Chang

This inventor holds 1 USPTO granted patent. Top assignee: National Applied Research Laboratories. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jih-Sheng Chang. Retrieved from https://idiyas.com/inventor/jih-sheng-chang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Jih-Sheng Chang and Remote Monitor Abnormality Detection.

Introduction

Jih-Sheng Chang is an inventor associated with Hsinchu, Taiwan, and National Applied Research Laboratories. His patent work addresses automated detection and notification of abnormalities in remote monitoring systems.

Latest Patents

Chang is credited with 1 patent: “Distributed Automatic Notification Method for Abnormality in Remote Massive Monitors.” The invention describes processing a data stream into continuous video, dividing it into single-frame images and image grids, and analyzing selected pixels to calculate image-grid statistics. Those statistics are used to determine whether image grids are monochromatic and, when consecutive frames are monochromatic, to assess their color. If a data stream is unavailable, the method generates a disconnect prompt stream.

Career Highlights

Chang’s listed patent focuses on identifying abnormal conditions in large-scale remote monitoring systems and automatically notifying users. His work is associated with National Applied Research Laboratories.

Collaborations

The provided information lists Yun-Te Lin and Yi-Hao Hsiao as Chang’s coworkers.

Conclusion

Jih-Sheng Chang’s patent describes a structured approach to detecting monochromatic video frames and stream disconnections, supporting automated abnormality notification in remote monitoring systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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