Willimantic, CT, United States of America

Jifeng Chen


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2016-2018

where 'Filed Patents' based on already Granted Patents

4 patents (USPTO):

Title: The Innovation Journey of Inventor Jifeng Chen

Introduction:

Jifeng Chen, a talented inventor based in Willimantic, CT (US), has made significant contributions to the field of reliability testing with his innovative methods and systems. With a total of 4 patents to his name, Jifeng Chen continues to impress with his groundbreaking work.

Latest Patents:

His latest patents revolve around "Integrated time dependent dielectric breakdown reliability testing." These patents detail methods and systems for reliability testing that involve measuring leakage currents and correlating them with optical emissions to pinpoint defects within a device under test.

Career Highlights:

Currently employed at IBM, Jifeng Chen is a key player in driving innovation within the renowned technology company. His expertise in reliability testing has helped IBM stay at the forefront of technological advancements.

Collaborations:

Collaborating with talented individuals such as Dirk Pfeiffer and Thomas M Shaw, Jifeng Chen has been able to exchange ideas, innovate, and bring his groundbreaking concepts to life. These collaborations have further enriched his career and propelled his innovations to new heights.

Conclusion:

In conclusion, Jifeng Chen's inventive spirit and dedication to advancing reliability testing have solidified his position as a trailblazer in the field. His patents and collaborations stand as a testament to his commitment to innovation and his contribution to the world of technology.

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