This inventor holds 1 USPTO granted patent. Top assignee: Shanghai Jiao Tong University. Active years: 2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2017
Title: Innovations by Jiejie Dai in Circuit Fault Detection
Introduction
Jiejie Dai is an accomplished inventor based in Shanghai, China. He has made significant contributions to the field of electrical engineering, particularly in the area of circuit fault detection. His innovative approach addresses common challenges faced in distribution network circuits.
Latest Patents
Jiejie Dai holds a patent for a method titled "Method for locating distribution network circuit fault based on full waveform information." This method focuses on detecting and locating faulty lines in distribution network circuits using full waveform information. It leverages current data from fault occurrences and the operation of compensation devices to tackle issues such as low fault current and poor reliability. By employing precise GPS synchronization, this method enhances the sensitivity and reliability of grounding fault detection without interfering with the system, making it suitable for high-resistance grounding applications.
Career Highlights
Dai is affiliated with Shanghai Jiaotong University, where he contributes to research and development in electrical engineering. His work has garnered attention for its practical applications in improving the reliability of electrical systems.
Collaborations
Jiejie Dai has collaborated with notable colleagues, including Yadong Liu and Gehao Sheng, to advance research in his field. Their combined expertise has led to innovative solutions in circuit fault detection.
Conclusion
Jiejie Dai's contributions to the field of electrical engineering, particularly through his patented method for circuit fault detection, demonstrate his commitment to innovation and reliability in electrical systems. His work continues to influence advancements in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
