Kanagawa, Japan

Jiechen Lu

This inventor holds 1 USPTO granted patent. Top assignee: Aesc Japan Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jiechen Lu. Retrieved from https://idiyas.com/inventor/jiechen-lu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jiechen Lu: Battery Invention and Patent

Introduction

Jiechen Lu is an inventor associated with Aesc Japan Ltd. in Kanagawa, Japan. His patent work includes an invention concerning battery electrode alignment.

Latest Patents

The provided information lists one patent for Lu: “Battery.” The invention describes a stacked battery structure in which the outer edges of the negative and positive electrodes, each covered by a first adhesive member, are substantially aligned. The negative electrode’s covered outer edge is positioned from 0% to 200% of the negative electrode’s thickness from the positive electrode’s covered outer edge, measured in the specified direction between the stacked body and the adhesive member. Lu is credited with 1 patent.

Career Highlights

Lu’s listed patent reflects work on battery construction, particularly the positioning of electrode edges and adhesive members within a stacked body. The provided information associates him with Aesc Japan Ltd.

Collaborations

Kenji Ohara and Naonori Matsumura are identified as Lu’s coworkers. The provided information does not specify their roles in the patent or whether they collaborated with him on the invention.

Conclusion

Jiechen Lu’s listed patent focuses on electrode-edge alignment in a battery, highlighting a specific structural approach to assembling a stacked battery.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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