This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Division of Flow Metrology, National Institute of Measurement and Testing Technology, National Institute of Measurement and Testing Technology. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Innovations of Jie Zhou in Micro Flow Measurement
Introduction
Jie Zhou is a notable inventor based in Chengdu, China. He has made significant contributions to the field of flow measurement technology. His innovative approach has led to the development of a unique micro flow measuring device.
Latest Patents
Jie Zhou holds a patent for a "Micro flow measuring device and method based on mass method." This invention discloses a measuring device that includes an inner anti-evaporation cover, an outer anti-evaporation assembly, a weighing balance, and a liquid collecting container. The device features a packing assembly made of a material with low water absorption, which is gas-permeable. An accommodating cavity is formed between the packing assembly and the bottom portion of the liquid collecting container to hold the liquid to be measured. Additionally, a capillary receiving tube is integrated into the design, allowing for precise measurement of liquid flow.
Career Highlights
Jie Zhou has worked at the National Institute of Measurement and Testing Technology, specifically in the Division of Flow Metrology. His expertise in this area has been instrumental in advancing measurement technologies.
Collaborations
Throughout his career, Jie Zhou has collaborated with notable colleagues, including Fan Luo and Rong Gan. Their combined efforts have contributed to the success of various projects in flow measurement.
Conclusion
Jie Zhou's innovative work in micro flow measurement showcases his dedication to advancing technology in this field. His patent and career achievements reflect his significant impact on measurement science.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile