Jie Xian

Title: Innovations by Jie Xian in Paper Thickness Detection

Introduction

Jie Xian is an accomplished inventor based in Shandong, China. He has made significant contributions to the field of paper thickness detection through his innovative methods and apparatus. His work is particularly relevant in industries where precise paper measurements are crucial.

Latest Patents

Jie Xian holds a patent for a "Method and apparatus for detecting thickness of paper and storage medium." This invention provides a systematic approach to measuring the thickness of paper. The method involves acquiring a first thickness image of the target paper and extracting various thickness features from this image. By processing the gray values of multiple pixel points, the invention can determine changes in thickness, enhancing the accuracy of paper measurement.

Career Highlights

Jie Xian is associated with Weihai Hualing Opto-electronics Co., Ltd., where he applies his expertise in optical electronics. His role in the company has allowed him to focus on developing advanced technologies that improve measurement techniques in various applications.

Collaborations

Jie Xian collaborates with notable colleagues, including Li Jiang and Rongxin Song. Their combined efforts contribute to the advancement of technology in their field, fostering innovation and development.

Conclusion

Jie Xian's contributions to the detection of paper thickness exemplify the importance of innovation in technology. His patent reflects a significant advancement in measurement techniques, showcasing his expertise and commitment to improving industry standards.