The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
May. 17, 2019
Weihai Hualing Opto-electronics Co., Ltd., Shandong, CN;
Li Jiang, Shandong, CN;
Rongxin Song, Shandong, CN;
Xiumei Qi, Shandong, CN;
Jie Xian, Shandong, CN;
WEIHAI HUALING OPTO-ELECTRONICS CO., LTD., Shandong, CN;
Abstract
Provided are a method and an apparatus for detecting a thickness of paper, and a storage medium. The method includes: acquiring a first thickness image of a target paper; extracting at least one first thickness feature and at least one second thickness feature from the first thickness image in the first thickness image; performing average processing on gray values of multiple pixel points in the at least one first thickness feature to acquire a first gray value, and the average processing is performed on gray values of the multiple pixel points in the at least one second thickness feature to acquire a second gray value; when the first gray value is smaller than the second gray value of multiple pixel points in at least one second thickness feature, determining that a thickness of a region, corresponding to the at least one second thickness feature, on the target paper has changed.