Jie Wang

Title: Innovations of Jie Wang in Measurement Systems

Introduction

Jie Wang is a notable inventor based in Anhui, China. He has made significant contributions to the field of measurement systems, particularly in the area of detecting deep-hole surface topography. With a total of 3 patents to his name, Wang's work showcases his expertise and innovative spirit.

Latest Patents

One of Jie Wang's latest patents is a "Measurement system for detecting deep-hole surface topography based on low-coherence interferometry." This advanced measurement system includes a detection part and an autocollimation system. The detection part features a white light interferometric system, which consists of a 1550 nm amplified spontaneous emission (ASE) broadband light source, a first reflector, a first beam splitting prism, a second reflector, and a reference reflector arranged in sequence. A to-be-measured deep-hole and a near-infrared camera are positioned on either side of the first beam splitting prism, while a conical prism is placed inside the deep-hole. The autocollimation system, located between the deep-hole and the first beam-splitting prism, includes a 630 nm light source, a dichroic prism, a second beam-splitting prism, a third reflector, and a quadrant detector arranged in sequence.

Career Highlights

Jie Wang is affiliated with Hefei University of Technology, where he continues to advance his research and development efforts. His work has garnered attention for its practical applications and innovative approaches to measurement technology.

Collaborations

Wang collaborates with esteemed colleagues such as Huining Zhao and Xiaoying Hou, contributing to a dynamic research environment that fosters innovation and discovery.

Conclusion

Jie Wang's contributions to measurement systems exemplify the impact of innovative thinking in technology. His patents reflect a commitment to advancing the field and improving measurement techniques.