Little Falls, NJ, United States of America

Jie Ren

This inventor holds 2 USPTO granted patents. Top assignee: Amd Design, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jie Ren. Retrieved from https://idiyas.com/inventor/jie-ren-n2725cpg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Jie Ren: Inventor of Transceiver Protection Technology.

Introduction

Jie Ren is an inventor based in Little Falls, New Jersey. His patent work includes a device designed to protect a transceiver and its cable connection. Ren is associated with Amd Design, LLC, and has 2 patents.

Latest Patents

Ren’s latest listed patent is titled “Transceiver Protection Device.” It describes a body that couples to a cable, which connects to a transceiver. A detach component extends from the body and can receive a force to detach the cable from the transceiver. When the cable is connected, the detach component sits adjacent to the transceiver. The device also includes a catch component designed to fit into an aperture in a transceiver hanger.

The supplied patent information lists “Transceiver Protection Device” twice. No details were provided to distinguish the two entries.

Career Highlights

Ren’s listed invention focuses on protecting a transceiver connection and providing components for detaching and securing the cable assembly. His work is associated with Amd Design, LLC.

Collaborations

Ren’s listed coworker is Justin Widodo Purnamasidi. The available information does not specify the nature of their collaboration.

Conclusion

Jie Ren’s patent work, as described in the supplied information, centers on a transceiver protection device that combines cable detachment and attachment features.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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