Suzhou, China

Jie Ma

This inventor holds 1 USPTO granted patent. Top assignee: Nuovo Film Suzhou China Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jie Ma. Retrieved from https://idiyas.com/inventor/jie-ma-j6q27d50

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Jie Ma - Innovator in Touch Sensor Technology

Introduction

Jie Ma is a prominent inventor based in Suzhou, China. He has made significant contributions to the field of touch sensor technology. His innovative approach has led to the development of a unique touch sensor that enhances user interaction with devices.

Latest Patents

Jie Ma holds a patent for a "Touch sensor and method for making the same." This invention provides a touch sensor that includes a substrate, an electrode layer located in a window area, and a frame trace located in a frame trace area. The frame trace consists of a plurality of metal wires, each connected to a corresponding electrode in the electrode layer. The design allows for a reduction in the width of the frame trace area, improving the overall efficiency of the touch sensor.

Career Highlights

Jie Ma is currently employed at Nuovo Film Suzhou China Inc., where he continues to innovate in the field of touch sensors. His work has garnered attention for its practicality and effectiveness in enhancing touch technology.

Collaborations

Jie Ma collaborates with talented coworkers, including Biao Deng and Bei Lei. Their combined expertise contributes to the advancement of technology at their company.

Conclusion

Jie Ma's contributions to touch sensor technology exemplify his innovative spirit and dedication to improving user experience. His patent and ongoing work at Nuovo Film Suzhou China Inc. highlight his role as a key player in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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