Location History:
- Bei Bei District, CN (2015)
- Chongqing, CN (2017)
Company Filing History:
Years Active: 2015-2017
Title: Innovations of Jie Hou in Surface Property Parameter Measurement
Introduction
Jie Hou is an accomplished inventor based in Chongqing, China. He has made significant contributions to the field of surface property parameter measurement, holding a total of 2 patents. His work focuses on developing systems and processes that enhance the accuracy and efficiency of measuring surface properties of various substances.
Latest Patents
One of Jie Hou's latest patents is titled "System and process for determining and analysing surface property parameters of substance based on kinetic method." This invention provides a comprehensive system that includes a sample processing system and a detection system. The sample processing system consists of a reactor, a collector for liquid to be tested, and a container for liquid to be tested. The detection system features a detecting electrode, a concentration and activity operator, a kinetic data processor, a surface property operation module, and a result output module. The process involves treating the substance with an electrolyte solution, measuring the activity of the liquid at predetermined intervals, and processing the data to obtain surface property parameters.
Another notable patent is the "Substance surface property parameter measurement method and substance surface property parameter analysis system." This method involves saturation processing of a material's surface, mixing it with an electrolyte solution, and measuring the balanced concentration values of positive ions. The method allows for the calculation of surface potential, specific surface area, surface charge density, and total surface charge of the material.
Career Highlights
Jie Hou is affiliated with Southwest University, where he continues to advance research in surface property measurements. His innovative approaches have garnered attention in the scientific community, contributing to the understanding of material properties and their applications.
Collaborations
Jie Hou has collaborated with notable colleagues, including Hang Li and Hualing Zhu. Their combined expertise has furthered research initiatives and fostered innovation in their respective fields.
Conclusion
Jie Hou's contributions to the field of surface property parameter measurement demonstrate his commitment to innovation and research. His patents reflect a deep understanding of material science and a drive to improve measurement techniques. His work continues to influence advancements in this important area of study.