The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
Oct. 13, 2009
Hang LI, Bei Bei District, CN;
Hualing Zhu, Bei Bei District, CN;
Jie Hou, Bei Bei District, CN;
Laosheng Wu, Bei Bei District, CN;
Hang Li, Bei Bei District, CN;
Hualing Zhu, Bei Bei District, CN;
Jie Hou, Bei Bei District, CN;
Laosheng Wu, Bei Bei District, CN;
Southwest University, Bei Bei District, Chongqing, CN;
Abstract
A method for measuring surface property parameters of a material comprises: performing saturation processing on a surface of a material; mixing the material which has been processed by saturation with an indicating electrolyte solution; after the mixture solution achieves an balance by ion exchange, measuring the balanced concentration values of positive ions of the indicating electrolyte and H+ in the mixture solution; according to the balanced concentration values of positive ions of the indicating electrolyte, calculating surface potential of the material; and according to the surface potential of the material, calculating specific surface area and surface charge density of the material; according to surface charge density of the material, calculating surface electric field intensity; according to surface charge density and specific surface area of the material, calculating total surface charge of the material. A system for measuring surface property parameters of a material can be based on the method.