Jie-Hong Wang

Title: Jie-Hong Wang: Innovator in Chip Testing Technology

Introduction

Jie-Hong Wang is a notable inventor based in Tao-Yuan Hsien, Taiwan. He has made significant contributions to the field of chip testing technology. His innovative approach has led to the development of a unique testing method that addresses the latch-up phenomenon in chips.

Latest Patents

Wang holds a patent for a "Universal test platform and test method for latch-up." This invention provides a method for testing the latch-up phenomenon of a chip. The process involves using a test platform that stores a test program for the chip. The method includes several steps: obtaining the test program, acquiring pin data, setting an initial value for an input pin, and providing a test current to measure the current between the power and ground ends of the chip. This method ensures that the current does not exceed a predetermined value, thereby enhancing the reliability of chip testing.

Career Highlights

Jie-Hong Wang is currently employed at Faraday Technology Corporation, where he continues to innovate in the field of semiconductor technology. His work has been instrumental in advancing testing methodologies that improve chip performance and reliability.

Collaborations

Wang collaborates with talented professionals such as Kai-Jen Ko and An-Ru Andrew Cheng. Their combined expertise contributes to the development of cutting-edge technologies in the semiconductor industry.

Conclusion

Jie-Hong Wang's contributions to chip testing technology exemplify the impact of innovative thinking in the field of electronics. His patent for a universal test platform showcases his commitment to enhancing chip reliability and performance.