The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
May. 05, 2004
Applicants:
Jie-hong Wang, Tao-Yuan Hsien, TW;
Kai-jen Ko, Hsin-Chu, TW;
An-ru Cheng, Hsin-Chu, TW;
Inventors:
Assignee:
Faraday Technology Corp., Hsin-Chu, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for testing latch-up phenomenon of a chip is provided. The chip is tested on a test platform, the test platform storing a test program of the chip for testing the chip. The method includes (a) obtaining the test program of the chip tested on the test platform, (b) obtaining pin data of the chip by the test program of the chip, (c) setting up an input pin of the chip with an initial value, and (d) providing a test current to the pin of the chip, and then measuring the current between a power end and a ground end of the chip to see if it exceeds a first predetermined value.