This inventor holds 3 USPTO granted patents. Top assignee: Nippon Sanso Corporation. Active years: 2002-2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2002-2004
Title: Innovations of Jie Dong in Spectroscopic Methods
Introduction
Jie Dong is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of spectroscopy, particularly in the analysis of isotopes and gases. With a total of 3 patents to his name, his work has advanced the capabilities of measurement systems in scientific research.
Latest Patents
One of Jie Dong's latest patents is a spectroscopic method for analyzing isotopes using a semiconductor laser. This invention simplifies the measurement system and enhances the accuracy and sensitivity of isotope identification. The method employs a semiconductor laser beam with a wavelength in the 2000 nm band, which serves as the source for the absorption spectra of isotopes. Additionally, a reference gas is utilized to identify isotopes, containing collating components with known absorption spectra wavelengths that are close to those of the isotopes being analyzed. Another notable patent is a spectroscopic method for analyzing gases using a laser beam, which further showcases his innovative approach to spectroscopy.
Career Highlights
Jie Dong is currently associated with Nippon Sanso Corporation, where he continues to develop and refine his inventions. His work has been instrumental in enhancing the precision of spectroscopic techniques, making significant impacts in various scientific fields.
Collaborations
Some of his notable coworkers include Koh Matsumoto and Katsumasa Suzuki, who have collaborated with him on various projects, contributing to the advancement of their shared research goals.
Conclusion
Jie Dong's innovative contributions to spectroscopy, particularly in isotope and gas analysis, highlight his role as a leading inventor in this field. His patents reflect a commitment to improving measurement systems and enhancing scientific understanding.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile