Shenzhen, China

Jie Dai

This inventor holds 1 USPTO granted patent. Top assignee: Shenzhen Goodix Technology, Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jie Dai. Retrieved from https://idiyas.com/inventor/jie-dai-882zcuue

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jie Dai and Signal-Processing Innovation.

Introduction

Jie Dai is an inventor based in Shenzhen, China, associated with Shenzhen Goodix Technology, Ltd. His patent work includes an invention for signal processing that addresses how pulse-width-modulated signals are converted into output signals.

Latest Patents

Dai is named on 1 patent: “Method for Signal Processing, Circuit for Signal Processing, Chip for Signal Processing, and Electronic Device.” The patent describes performing pulse-width modulation on an input signal to produce positive and negative PWM signals, then generating corresponding positive and negative output signals. When the input’s absolute amplitude exceeds a threshold, one output omits a pulse while the other contains two pulses within a pulse period. The disclosed approach aims to improve output-signal performance.

Career Highlights

Dai’s identified patent reflects work spanning signal-processing methods, circuits, chips, and electronic devices. His association with Shenzhen Goodix Technology, Ltd. connects this work to a company developing technology products.

Collaborations

Jiangyang Peng and Yuqing Yang are identified as Dai’s coworkers. Their names are also associated with the collaborative context provided for his patent work.

Conclusion

Jie Dai’s patent focuses on a signal-processing technique that shapes PWM-based outputs according to input amplitude, illustrating his contribution to electronic signal-processing innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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