This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Zte Corporation. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Jiaying You - Innovator in Measurement Configuration Technology
Introduction
Jiaying You is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of telecommunications, particularly in the area of measurement configurations. His innovative approach has led to the development of a unique patent that enhances the efficiency of inter-frequency measurement processes.
Latest Patents
Jiaying You holds a patent titled "Method and device for sending inter-frequency measurement configurations downwards." This patent describes a method for sending inter-frequency measurement configurations, which includes an eNB performing a swap action on a measurement configuration copy. The eNB generates a second measurement configuration based on its own configuration and UE capability, and compares it with the first one. Depending on the comparison results, the eNB sends a RRC connection reconfiguring message to the UE, optimizing the measurement configuration process.
Career Highlights
Jiaying You is associated with ZTE Corporation, a leading telecommunications company. His work at ZTE has allowed him to focus on innovative solutions that address complex challenges in the telecommunications industry. With a patent portfolio that includes 1 patent, he continues to push the boundaries of technology in his field.
Collaborations
Jiaying collaborates with talented colleagues, including Xiaoxi Jing and Xingang Wang. Their combined expertise fosters a creative environment that drives innovation and enhances the development of new technologies.
Conclusion
Jiaying You's contributions to the field of telecommunications through his patent and work at ZTE Corporation exemplify the spirit of innovation. His efforts in improving measurement configurations are paving the way for advancements in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
