Beijing, China

Jiawei He

This inventor holds 2 USPTO granted patents. Top assignees: Beijing Tusen Zhitu Technology Co., Ltd., Beijing Zitiao Network Technology Co., Ltd.. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jiawei He. Retrieved from https://idiyas.com/inventor/jiawei-he-0zdz5q1i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 50.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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2 patents (USPTO):Explore Patents

Title: Jiawei He - Innovator in Multi-Object Tracking Technology

Introduction

Jiawei He is a prominent inventor based in Beijing, China. He has made significant contributions to the field of multi-object tracking technology. His innovative approach has led to the development of a unique training method for multi-object tracking models.

Latest Patents

Jiawei He holds a patent for a "Training method for multi-object tracking model and multi-object tracking method." This patent outlines a comprehensive method that includes constructing an object graph based on the objects to be tracked in a current frame. The method involves performing graph matching to calculate matching scores between the objects and tracked tracklets, ultimately determining the matched tracklet of the object to be tracked.

Career Highlights

Jiawei He is associated with Beijing Tusen Zhitu Technology Co., Ltd., where he applies his expertise in developing advanced tracking technologies. His work has garnered attention for its innovative approach and practical applications in various fields.

Collaborations

Some of his notable coworkers include Zehao Huang and Naiyan Wang, who contribute to the collaborative efforts in advancing the technology at their company.

Conclusion

Jiawei He is a key figure in the realm of multi-object tracking, with a patent that showcases his innovative methods. His contributions continue to influence the development of tracking technologies in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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