Company Filing History:
Years Active: 2021-2023
Title: Innovations of Jianwei Chen in the Field of Device Fault Detection
Introduction
Jianwei Chen is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of device fault detection, particularly through his innovative approaches in the Internet of Things (IoT). With a total of 3 patents, his work has garnered attention for its practical applications in enhancing device reliability.
Latest Patents
One of Jianwei Chen's latest patents focuses on Internet-of-Things edge services for device fault detection based on current signals. This patent outlines methods, systems, and computer-readable storage media for receiving current signal data that represents a driving current applied to a device over a time period. The data is processed through a deep neural network (DNN) module, a frequency spectrum analysis (FSA) module, and a time series classifier (TSC) module to provide indications of normal or anomalous operation of the device. The system also includes a voting gate to deliver an output indication, which can trigger alerts or messages based on the device's operational status.
Another notable patent by Chen involves systems and methods for failure diagnosis using a fault tree. This computer-implemented method includes receiving a fault tree that represents a top event and various basic events connected by logic gates. The method calculates reliability parameters and fault tree importance measures, ranks the basic events based on failure impact factors, and identifies the most significant contributor to the top event. This innovative approach enhances the accuracy of failure diagnosis in complex systems.
Career Highlights
Jianwei Chen has worked with notable organizations such as SAP SE and Shanghai Jiao Tong University. His experience in these institutions has allowed him to collaborate with leading experts in the field and further develop his innovative ideas.
Collaborations
Some of Jianwei Chen's coworkers include Jie He and Xuemin Wang. Their collaborative efforts have contributed to the advancement of technology in device fault detection and related fields.
Conclusion
Jianwei Chen's contributions to the field of device fault detection through his innovative patents demonstrate his expertise and commitment to enhancing technology. His work continues to influence the development of reliable IoT systems.