The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
Aug. 28, 2020
Sap SE, Walldorf, DE;
Jie He, Shanghai, CN;
Jianwei Chen, Shanghai, CN;
Lin Cai, Shanghai, CN;
Xiaoling Zhou, Shanghai, CN;
Xuemin Wang, Shanghai, CN;
SAP SE, Walldorf, DE;
Abstract
A computer-implemented method for failure diagnosis using fault tree can include: receiving a fault tree comprising a node representing a top event, a plurality of nodes representing respective basic events, and one or more logic gates connecting the plurality of nodes representing the respective basic events to the node representing the top event; obtaining reliability parameters corresponding to the basic events; calculating fault tree importance measures corresponding to the basic events; calculating failure impact factors of the top event corresponding to the basic events, wherein the failure impact factors of the top event are products of the corresponding reliability parameters and the corresponding fault tree importance measures; ranking the basic events based on the failure impact factors of the top event; and identifying a most significant contributor to the top event, wherein the most significant contributor is a basic event having the highest failure cause probability of the top event.