Hangzhou, China

Jianqiu Pan

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Zoom Communications, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jianqiu Pan. Retrieved from https://idiyas.com/inventor/jianqiu-pan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Jianqiu Pan in Database Error Monitoring

Introduction

Jianqiu Pan is a notable inventor based in Hangzhou, China. He has made significant contributions to the field of database management, particularly in identifying double write errors. His innovative approach has the potential to enhance the reliability of database systems.

Latest Patents

Jianqiu Pan holds a patent for a method titled "Identifying double write errors in databases." This patent outlines techniques for monitoring double write errors in databases. The method involves a computing device that receives indications of database writes and determines the time interval between them. If the interval is less than a predefined threshold, the device compares the information from both writes to identify discrepancies. It then generates a notification to correct the double write error, ensuring data integrity.

Career Highlights

Jianqiu Pan is currently employed at Zoom Communications, Inc. His work focuses on improving database systems and enhancing their performance. With a patent portfolio that includes 1 patent, he has established himself as an expert in his field.

Collaborations

Jianqiu has collaborated with talented coworkers such as Liang Lu and Xiaoyan Sun. Their combined efforts contribute to the innovative projects at Zoom Communications, Inc.

Conclusion

Jianqiu Pan's contributions to database error monitoring exemplify the importance of innovation in technology. His work not only addresses critical issues in data management but also paves the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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