Jiann Minn Chin

Title: Jiann Minn Chin: Innovator in Electro-Optic Waveform Analysis

Introduction

Jiann Minn Chin is a notable inventor based in Singapore, recognized for his contributions to the field of electro-optic waveform analysis. His innovative work has led to the development of a unique patent that enhances the measurement of signals from devices under test.

Latest Patents

Jiann Minn Chin holds a patent titled "Analysis of Electro-Optic Waveforms." This invention utilizes an optic probe to measure signals from a device under test. The optic probe is strategically positioned at a target probe location within a cell of the device, which includes a target net to be measured alongside multiple non-target nets. A test pattern is applied to the cell, and a laser probe (LP) waveform is obtained in response. The target net waveform is extracted from the LP waveform through a series of steps, including simulating a combinational logic analysis (CLA) cross-talk waveform, estimating a cross-talk weight, and determining the target net waveform by weighting and subtracting the CLA cross-talk waveform from the LP waveform.

Career Highlights

Jiann Minn Chin is currently employed at Advanced Micro Devices Corporation, where he continues to push the boundaries of innovation in his field. His work at AMD has allowed him to apply his expertise in electro-optic technologies and contribute to the advancement of electronic devices.

Collaborations

Throughout his career, Jiann has collaborated with talented individuals such as Venkat Krishnan Ravikumar and Nathan Linarto. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Jiann Minn Chin's contributions to the field of electro-optic waveform analysis exemplify the spirit of innovation. His patent and work at Advanced Micro Devices Corporation highlight his commitment to advancing technology and improving measurement techniques in electronic devices.