Shenzhen, China

Jianjun Qiu

This inventor holds 3 USPTO granted patents and 1 published patent application and 2 EPO patents. Top assignees: Huawei Technologies Co., Limited, Huawei Technologies Co., Ltd.. Active years: 2016-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jianjun Qiu. Retrieved from https://idiyas.com/inventor/jianjun-qiu-flkhb5r4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2016-2026

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3 patents (USPTO):Explore Patents

Title: The Innovative Mind of Jianjun Qiu

Introduction

Jianjun Qiu is a prominent inventor based in Shenzhen, China. He is known for his contributions to the field of fault diagnosis methods and apparatuses. His innovative approach ensures that fault diagnosis is performed securely, complying with relevant security laws and regulations.

Latest Patents

Jianjun Qiu holds a patent for a fault diagnosis method and apparatus. The patent outlines a process that involves determining whether a terminal of each user allows performing fault diagnosis for a specific service. If permitted, the fault diagnosis can be executed, ensuring that it is conducted in a secure environment. This method enhances the reliability and security of user-related services.

Career Highlights

Jianjun Qiu is currently employed at Huawei Technologies Co., Limited, a leading global provider of information and communications technology (ICT) infrastructure and smart devices. His work at Huawei has allowed him to develop and refine his innovative ideas in the field of technology.

Collaborations

Some of Jianjun Qiu's notable coworkers include Ying Li and Peng Wu. Their collaboration has contributed to the advancement of technology and innovation within their projects.

Conclusion

Jianjun Qiu's work exemplifies the importance of innovation in technology, particularly in ensuring secure fault diagnosis methods. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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